Service Manuals, User Guides, Schematic Diagrams or docs for : Agilent 5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2]

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5991-4598EN 7500 ILM Atomic Force Microscope (AFM) - Data Sheet c20141107 [2]


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                                                                                                          Data Sheet
                              Keysight 7500ILM
                              AFM Imaging on an Inverted Light Microscope


                                            Overview
                                            The 7500 inverted light microscope (ILM) system combines the power of a high-resolution
                                            atomic force microscope (AFM) with the direct optical viewing capability of an ILM.

                                            The Keysight ILM offers unparalleled performance and ease of use for imaging in luids.
                                            It extends AFM utility in order to encompass studies of single molecules, polymers, cell
                                            membranes, whole cells, and much more. Atomic force and optical luorescence, FRET,
                                            darkield and brightield microscopy data can be obtained simultaneously.

                                            The ILM's patented mounting design incorporates a rigid structure that provides the
                                            low noise loor needed to obtain sub-nanometer resolution. Furthermore, the advanced
                                            design allows the AFM to sit on top of an inverted microscope and under the illumination
                                            pillar, resulting in superior optical contrast for the images.

                                            Keysight's QuickSlide sample-loading mechanism and a lexible sample-handling
                                            plate make sample preparation easy. The AFM is mounted on the QuickSlide assembly,
Features and Beneits                        allowing the user to change samples and/or solutions without affecting the alignment of
                                            the AFM or the optical microscope.



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