Service Manuals, User Guides, Schematic Diagrams or docs for : Agilent 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 [20]

<< Back | Home

Most service manuals and schematics are PDF files, so You will need Adobre Acrobat Reader to view : Acrobat Download Some of the files are DjVu format. Readers and resources available here : DjVu Resources
For the compressed files, most common are zip and rar. Please, extract files with Your favorite compression software ( WinZip, WinRAR ... ) before viewing. If a document has multiple parts, You should download all, before extracting.
Good luck. Repair on Your own risk. Make sure You know what You are doing.




Image preview - the first page of the document
5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 [20]


>> Download 5991-2524EN Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note c20140917 [20] documenatation <<

Text preview - extract from the document
Keysight Technologies
Optimizing On-Wafer Noise Figure
Measurements up to 67 GHz




                           Application Note
Introduction

     Noise figure (NF) measurements are often an essential part of device characterization in R&D
     and process verification in manufacturing. Getting accurate on-wafer NF measurements can be
     quite challenging, and the ability to get good results depends on the methodology and the test
     configuration.

     Two techniques are commonly used to measure NF: the Y-factor method and the cold-source
     method. The Y-factor or hot/cold-source method is the predominant approach and is most commonly
     implemented with noise-figure analyzers and spectrum analyzer-based solutions. In contrast, the
     cold-source method is usually performed using vector network analyzers (VNAs), which provide
     magnitude and phase information. As a result, the cold-source technique makes it possible to achieve
     much greater accuracy in NF measurements.

     This application note presents a cold-source solution based on the Keysight Technologies, Inc.
     PNA-X microwave network analyzer. When equipped with the optional source-corrected NF
     measurements (Option 029), the PNA-X provides exceptional accuracy. New hardware provides a
     convenient way to make measurements up to 50 GHz. Now, additional external hardware is needed
     only when making measurements from 50 GHz to 67 GHz. The PNA-X also enables a time-saving
     advantage: the ability to make multiple measurements such as noise figure, S-parameters, gain
     compression and intermodulation distortion (IMD) with a single set of connections to the device
     under test (DUT).
03 | Keysight | Optimizing On-Wafer Noise Figure Measurements up to 67 GHz - Application Note



                                                             Overview: Noise figure
                                                             Noise factor, which is linear, and noise figure, which is logarithmic, are very
                                                             useful 



◦ Jabse Service Manual Search 2024 ◦ Jabse PravopisonTap.bg ◦ Other service manual resources online : FixyaeServiceinfo