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5989-0547EN


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Impedance Characteristic Evaluation
of SMD by Using the ENA with
Inter-Continental Microwave (ICM)
Test Fixture

Application Note 1463-5
                                               With the trend of wireless communications and digital equipment operating
Introduction                                   at higher frequencies, the need to evaluate RF components under higher
                                               and wider frequencies is becoming increasingly important. Generally, an
                                               RF impedance analyzer is used for impedance measurement up to 3 GHz;
                                               however, beyond this frequency range, a network analyzer is commonly used.
                                               The network analyzer is a convenient instrument for measuring impedance
                                               over a wide frequency range, but measurement accuracy is degraded in
                                               comparison with the RF impedance analyzer1. This application note
                                               describes impedance characteristic evaluation of SMD by using the ENA RF
                                               network analyzer with the ICM test fixture. In addition, we also explain the
                                               TRL calibration procedure using the ENA with ICM test fixture (TF-3001-S),
                                               special considerations for measuring surface-mount devices (SMD), and
                                               impedance characteristic evaluation using the impedance parameter
                                               display software.




1. For information on the comparison between
   an impedance analyzer and a network
   analyzer, refer to reference application
   note 1369-2




2
                  This section describes the TRL Calibration procedure using the ENA, ICM
TRL Calibration   test fixture (TF-3001-S), and TRL calibration kit (TRL-3004B).
Procedures
                  Figure 1 shows the ICM test fixture mainframe (TF-3000 Series) and the
                  calibration kit (TRL-3004B).




                  Figure 1. Test fixture mainframe (TF-3000 Series) and calibration kit (TRL-3004B)

                  Step 1. Setting of the ENA
                  Before performing the TRL error correction, basic measurement parameters
                  such as test frequency range, IFBW, power level, and measurement points
                  should be set in advance. Please note that if you change measurement
                  parameters such as test frequency range after performing error correction,
                  the calibration data will be changed to compensation data, and this may
                  degrade measurement accuracy. In the case of the ENA, once calibration
                  data is changed to compensation data, status display "Cor", which is located
                  on the bottom-right corner of the screen, will be changed to "C?".




                                                                                                      3
    Step 2. Define the calibration kit
    To ensure an accurate calibration, it is very important that the standard
    coefficient of the calibration kit (TRL-3004B) be entered in the ENA. The
    standard coefficient is provided with the calibration kit and each data item
    should be entered correctly. Table 1 shows examples of standard coefficient
    definitions.

    Table 1. Examples of standard coefficient definitions (TRL-3004B)
            Standard                       Offset                     Frequency         Standard
                                                                        (GHz)             label
      No.        Type           Delay         Z0        Loss        Lower    Upper
                                  ps                    G/s
       1        Short            



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