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               HP Archive


This vintage Hewlett Packard document was preserved
                  and distributed by
               www. hparchive.com
             Please visit us on the web !




            On-line curator: Glenn Robb
     This document is for FREE distribution only!
  RF MEASUREMENTS OF
FIBER OPTIC COMPONENTS


                Roger'Vong
        Network Measurements Division
        1400 Fountain Grove Parkway
           Santa Rosa, CA 95401




 RF & Microwave
 Measurement
 Symposium
 and
 Exhibition


 rli~   HEWLETT
 ~~ PACKARD




            www.HPARCHIVE.com
                    RF MEASUREMENTS OF FIBER OPTIC COMPONENTS



                                       ABSTRACT


RF network analysis is a useful technique for measuring the baseband electrical
characteristics of fiber optic components.  This paper is intended as a
measurements tutorial and presents a brief description of the measurement theory
and measurement block diagrams, including discussion of instrumentation
requirements for attenuation and bandwidth measurements of optical fiber.   In
addition, fault location and modal dispersion measurements achieved through
conversion of frequency domain information via the inverse Fourier transform to
the time domain are described.



Author:  Roger Wong is all Engineering Project Manager in the economy vector
network analyzer section of the Network Measurements Division of Hewlett Packard
Company, located in Santa Rosa, California.   He graduated from Oregon State
University (BSEE) and Columbia Universtiy (MSEE).   With HP since 1968, projects
included development of microwave microcircuits, devices, and components for HP
component products and microwave instruments.




                                www.HPARCHIVE.com
                                                    Introduction:   RF characterization of
                                                    fiber optic components is becoming more
                                                    necessary as system modulation rates
                                                    increase to microwave frequencies.   RF
                                                    network analyzers have been used to
                                                    characterize electronic components for
   RF MEASUREMENTS                                  years and are becoming more commonplace.
           OF                                       Additionally, network analyzers with
                                                    suitable optical converters can be used

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