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                 TRL CALIBRATION FOR
        NON-COAXIAL                        MEASUREMENTS




                     Speaker
                 Kevin Rochford
            Hewlett-Packard Company
              29 Burlington Mall Rd                     Semiconductor
             Burlington, MA 01803
                                                           Test
                       Author
                    Jim Curran
                                                         Symposium
         Nf'wtwork Measurements Division
            Hewlett-Packard Company
           1400 Fountaingrove Parkway
              Santa Rosa, CA 95403                        r~HEWLETT
                                                          ~~PACKARD




                                    www.HPARCHIVE.com
ABSll{ACT

A m:ljor problem encountered" hell m:lking net\\ork me:lsurel1lents in microstrip or othel
non-eo:lxial medi:l. is the need to separate the erreets or the tr:lnsmission media rrom the
device characteristics. While \eetor error-correction is userul ror remo\ ing system:ltic
errors in microwave networl\ mC:lsurements. the resultant accuracy is dependent on the
quality or the calibration standards. Unrortun:ltel~ the impedance stand:lrds used in
coaxial measurements arc dirficult to produce for non-coaxial transmission media.

A new calibration method, "Thru-Reflect-Line," hns been ndded to the HP 85108 network
analyzer, which relics onl~ on the charneteristie impedanec or n transmission line. In
addition to the simplicity of the calibration standards. this method is uscful for
calibration in both linear and dispersive (non-linear phase) transmission media. This
paper describes the benefits of direct. fully error-corrected measurement of non-coaxial
devices. Measurement examples or a microstrip transmission line. filtcr and microcircuit
amplifier will be shown.




                                              ..,



                                         www.HPARCHIVE.com
                                                                          There :Ire m:ln~ dc' i(es, r:lnging rrom tlansistor~
                                                                          :lnd p:lssive clements (resistors. indu(lOr::- and

'Cw                                                                       (:lp:lcitors) to complC\ microcircuits. "ith the
                                                                          (Ommon eh:lr:l(teristi( that they often dt\ Iwt h:l \ l'
                                                                          cO:1xial connectors. AS:1 rcsult these de\ ices :Ire
                       TRL      CALIBRATION                               difricult to measure with instruments thaI
                                                                          typic:1l1y have coaxi:ll test ports. This docs not.
                                  FOR                                     howcvcr, diminish the need to aecuratcl~
                                                                          characterize thc bchavior of such de\

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