Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley Appnotes 2662 OnWafer Reliability
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>> Download 2662 OnWafer Reliability documenatation <<Text preview - extract from the document A G R E AT E R M E A S U R E O F C O N F I D E N C E system is so well behaved. With two decades
of stable Si/SiO2 /polysilicon/Al materials
experience, the industry had little need for
a large cadre of materials physicists or the
infrastructure to train new ones. The indus-
try's complacency resulted in the atrophying
of the infrastructure needed to train the new
materials scientists who are required to over-
come the next wave of emerging materials
challenges.
Today, there is a lack of skilled scientists
who can develop new material systems, ex-
pand reliability test methodologies, and in-
terpret the huge volume of data this entails.
Unfortunately, we don't have the luxury of
waiting for the redevelopment of a materi-
als physicist infrastructure
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