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5989-2785EN English _ 2013-10-29 _ PDF 348 KB c20131030 [24]


>> Download 5989-2785EN English _ 2013-10-29 _ PDF 348 KB c20131030 [24] documenatation <<

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Agilent B1500A
Semiconductor Device Analyzer
Data Sheet




             Introduction
             The Agilent B1500A Semiconductor Device Analyzer is the only
             parameter analyzer with the versatility to provide a wide range of
             device characterization capabilities, uncompromised measurement
             reliability, and eficient and repeatable measurement. It supports all
             state-of-the-art measurements (IV, CV, and fast pulsed IV), giving
             it the ability to cover the electrical characterization and evaluation
             of devices, materials, semiconductors, active/passive components,
             or virtually any other type of electronic device. In addition, the
             B1500A's modular architecture with ten available slots allows you
             to add or upgrade measurement modules if your measurement
             needs change over time.

             Agilent EasyEXPERT, resident GUI-based software running on the
             B1500A's embedded Windows 7 platform, supports eficient and
             repeatable device characterization ranging from interactive manual
             measurements all the way up to test automation across a wafer
             in conjunction with a semiautomatic wafer prober. With hundreds
             of ready-to-use measurements (application tests) furnished at no
             charge, EasyEXPERT makes it easy to perform complex device char-
             acterization immediately. The EasyEXPERT GUI can be accessed
             using the B1500A's 15-inch touch screen, as well as through an
             optional USB keyboard and mouse. EasyEXPERT also allows you the
             option of storing test condition and measurement data automati-
             cally after each measurement in unique workspaces, ensuring that
             valuable information is not lost and that measurements can be
             repeated at a later date. Finally, EasyEXPERT has built-in analysis
             capabilities and a graphical programming environment that facilitate
             the development of complex testing algorithms.
Basic Features
Measurement capabilities:
Current versus voltage (IV) measurement        Pulse Generation                                 Speciication conditions



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