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5990-5071EN Improving Test Throughput with ASRU Speedup feature on the Medalist i3070 Series 5 c20140822 [8]


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Keysight Technologies
Improving Test Throughput
with ASRU Speedup Feature on
the Medalist i3070 Series 5



                           Application Note
Introduction

     The Keysight Technologies, Inc. all                                                         Microcontroller
     new next-generation Medalist i3070                                                               ADC
     Series 5 comes with a new analog                                                               detector
     stimulus response unit (ASRU revi-
     sion N) card along with software
     release 08.00p. The ASRU revision
     N card not only provides classical
     measurement operational amplifier                                                                  Rref
     (MOA) analog measurement capabil-
     ity but also includes a new digitized
     measurement circuitry (DMC) that          DAC
     can reduce unpowered analog test         source                   DUT
     time. Enabling the DMC for the ana-
     log test is called ASRU speedup.




                                                              Microcontroller
                                                                   ADC
                                                                 detector



                                             Figure 1: Digitized measurement circuitry (DMC) uses multiple microcontrollers
                                             to process all the measured values simultaneously.
What is ASRU                             What's Needed to Use ASRU Speedup?
Speedup?                                 The following are required when using the ASRU speedup feature:
ASRU speedup is a new software           1. ASRU revision N card or i3070 Series 5 testers
feature that uses the new DMC            2. Medalist i3070 with minimum software release 08.00p
engine to speed up the testing time.     3. Windows XP based PC Controller
The test source now accepts a new
test option,"as", which is the short     Using ASRU Speedup for New Test
form for "ASRU speedup". This test
option will instruct the system to       Program Development
measure the device under test (DUT)
with the DMC which employs multiple



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