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5990-9430EN Surviving State Disruptions Caused by Test_ A Case Study - Article Reprint c20140730 [16]


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Keysight Technologies
Surviving State Disruptions
Caused by Test: A Case Study



        Kenneth P. Parker, Keysight Technologies
        Shuichi Kameyama1, Fujitsu Limited
        David Dubberke, Intel Corporation
        1. Also with Ehime University, Matsuyama, Ehime, Japan.
Abstract         The practice of initializing a board or system for testing purposes is not an exact
                 science, but rather, pursued empirically and with an increasing risk of undesired
                 side effects. It has been suspected that Boundary-Scan testing can cause such
                 side effects. This paper provides a case study of such a board where a detailed
                 root-cause analysis was performed. Some issues are identified that justify add-
                 ing features to IEEE 1149.1 that will facilitate safe, fast and effective initializa-
                 tion of a board or system, to get it ready for testing and to leave it in a safe state
                 upon completion of testing.

1 Disclaimer     There is a Working Group for IEEE 1149.1 that is revising the standard and could
                 implement some of the ideas presented in this paper (see [IEEEWG]). The con-
                 tent of this paper may not reflect the group's final thinking and results. Opinions
                 stated throughout this paper are those of the authors.

                 Copyright



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