Service Manuals, User Guides, Schematic Diagrams or docs for : Agilent 5990-3672EN Keysight Pulsed-IV Parametric Test Solution - Selection Guide c20140829 [12]

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Keysight Technologies
Pulsed-IV Parametric Test Solutions



                                 Selection Guide
Introduction

     Pulsed-IV parametric testing is becoming an increasingly common requirement for the development
     of semiconductor process and the evaluation of semiconductor devices. In recent years, the need for
     very accurate pulsed IV measurement has increased due to the development of more advanced pro-
     cesses utilizing exotic materials, the push for devices with lower power consumption, and many other
     factors.

     To meet these needs Keysight Technologies, Inc. offers a variety of pulsed-IV parametric test solutions
     that supply the widest range of pulse widths, voltage/current output, and performance available in the
     industry. Each solution is well-proven and has already been used by many researchers worldwide to
     meet various advanced measurement needs. These range from the process development of cutting-
     edge technologies utilizing high-k gate dielectrics and SOI transistors to the evaluation of more
     conventional semiconductor process such as GaAs and HEMT or new materials such as SiC, GaN or
     Organic devices which require both high voltage and high current measurement capabilities.

     This selection guide provides an overview and side-by-side comparison of all of Keysight's pulsed-IV
     parametric test solutions to enable you to determine the best solution to meet your unique needs.




     Table 1. Multiple options for advanced pulsed measurement needs
Selecting the Best Solution to Meet Your Measurement Needs

This selection guide is designed to       5. Software is also key factor to                 need to put sufficient forethought
assist you in comparing Keysight's           control measurement equipment                  into the creation of the test struc-
pulsed-IV measurement solutions              or to synchronize two or more                  tures that will be used to make the
and selecting the best one for your          equipment on the Pulsed IV                     measurement. Attempts to make fast
measurement applications. By                 measurement. In some cases, the                pulsed measurements with conven-
following the steps outlined below           calculation is required to evaluate            tional DC test structures using DC
you should be able to determine the          current from voltage. Keysight sup-            positioners are in general unlikely to
proper measurement solution to meet          plies a library of application tests           yield good measurement results. In
your needs.                                  for performing pulsed IV measure-              general, fast pulsed measurements
                                             ment on the EasyEXPERT software.               require test structures designed
1. For each of the pulsed-IV specifica-                                                     for a ground-signal (GS) or ground-
   tions listed below, determine your     6. To succeed in making high speed                signal-ground (GSG) measurement
   measurement requirements.                 pulsed IV measurement you need                 environment and RF positioners. The
                                             more than just the correct mea-                following figure illustrates this point.
  Note: Make sure that you under-            surement instrumentation; you also
  stand that some solutions only
  work for specific device types and
  configurations.                                                                                 Drain pulse
                                                                                                    width
   

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