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5991-4167EN Physical Layer Testing of the USB 2.0 Serial Bus - Application Note c20141006 [10]


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Keysight Technologies
Physical Layer Testing
of the USB 2.0 Serial Bus
Using InfiniiVision 6000 X-Series
and Infiniium Series Oscilloscopes



           Application Note
Introduction

     The Universal Serial Bus was developed and standardized by a group of leading companies from the
     computer and electronics industries in 1995. These companies also formed the USB Implementers
     Forum, Inc. (USB-IF) as a non-profit corporation to publish the specifications and provide a support
     organization and forum for the advancement and adoption of USB technology.


     USB 2.0 Overview
     USB 2.0, which includes high-speed (480 Mbps), full-speed (12 Mbps) and low-speed(1.5 Mbps),
     is used today in a broad range of computers as well as embedded designs. One example of an
     embedded design is the automotive charging and sync USB port available in a variety of newer
     vehicles. Beyond traditional PC computers, most other types of electronic products, such as
     medical equipment or industrial control systems, include USB interfaces as well.

     With almost 20 years of functional interoperability experience behind it, any new products shipped
     must meet the user's expectations that it will just work. This is why testing and debugging USB
     designs using high-speed, full-speed or low-speed USB 2.0 interfaces is critical to ensure reliability
     of operation and meet end user expectations.

     To complement the USB specification in real products, the USB-IF maintains a compliance program
     that provides reasonable measures of acceptability. Products that pass compliance testing have
     the right to license the USB-IF certified USB Logo. One of the key components of USB compliance
     testing is physical layer testing. This has helped USB product success and acceptance by creating a
     very stable and interoperable ecosystem. Since that time USB has become ubiquitous. Over 10 billion
     USB products have shipped since its introduction and it has effectively replaced all other external IO
     interfaces. There are an estimated 4 billion USB products shipped annually 3/4 of them (3 billion) are
     using USB 2.0.

     USB-IF physical layer compliance certification is typically required by computer OEMs for suppliers
     of USB devices and silicon chip-sets. However, full compliance certification testing is typically not
     a requirement for embedded products. Nonetheless, R&D testing and verification of physical layer
     characteristics of embedded designs with integrated USB interfaces is extremely important to ensure
     reliable operation of end-products. Simply selecting USB components, integrating them into an
     embedded design, and then hoping that everything functions is not good enough. Even if the
     system appears to function, how much margin does it have? Or how does it perform under
     various environmental conditions such as temperature or humidity?

     This application note begins with a discussion of measurement requirements for the USB 2.0 serial
     bus. We then discuss how both the Keysight Technologies, Inc. 6000 X-Series and Infiniium Series
     oscilloscopes address these challenges and which scope is the best choice for the type of testing and
     test coverage the product developer needs to perform.
03 | Keysight | Physical Layer Testing of the USB 2.0 Serial Bus Using InfiniiVision 6000 X-Series and Infiniium Series Oscilloscopes 



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