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5991-4713EN Materials Measurement_ Dielectric Materials - Application Brief c20140717 [5]


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Keysight Technologies
Materials Measurement:
Dielectric Materials
Application Brief
02 | Keysight | Materials Measurement: Dielectric Materials - Application Brief



Overview                                                                          Solution
Increasing capability and performance of electronic equipment                     The parallel plate method uses two electrodes between which
are supported by the development of new devices, which in turn                    the material under test is sandwiched. The impedance of the
is enabled by progress in material science and process technolo-                  material is measured and converted to the complex permittivity
gies.                                                                             using the size of the material and the electrodes.

Dielectric materials play a key role in electronic circuits such as
capacitors or insulators. Characterization of these materials in
the early stage of development is essential to predict the perfor-
mance of the final devices.

The electrical properties of a dielectric material are character-
ized by its complex permittivity. The real part of permittivity, also
called dielectric constant, represents the material's ability to                         * =r '- jr "
store energy when an external electric field is applied. Materials                                    CP t       CP 



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