Service Manuals, User Guides, Schematic Diagrams or docs for : Agilent 5991-3093EN Protect Against Power-Related DUT Damage During Test - Application Note c20141107 [6]

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5991-3093EN Protect Against Power-Related DUT Damage During Test - Application Note c20141107 [6]


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Keysight Technologies
Protect Against Power-Related
DUT Damage During Test




        Application Note
Overview


     If you want to meet your delivery and budget goals, it is important to protect your devices against
     damage during test, especially for high-value aerospace/defense and automotive devices, but also
     for any devices that are time consuming and costly to replace. When the risk of device damage is
     of signiicant concern, test planning should include strategy and equipment that can help to reduce
     such risk. Choosing a power supply with extensive integrated protection features is the best way
     to avoid power-related damage to your DUT and to reduce test-system development investment
     by minimizing overall system hardware. In this application note, we will look at how the extensive
     protection features of the new Advanced Power System from Keysight Technologies, Inc. can protect
     your DUT from costly damage.


     Problem
     Controlling power supply output voltage and current to avoid overstressing the DUT under fault or
     near-fault conditions requires a rapid and effective response to a variety of situations. The primary
     causes of DUT failure are over-voltage and over-current events, some of which are very short duration
     while others endure until they are discovered.


     An over-voltage or over-current event can occur for a variety of reasons, including:
      



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