Service Manuals, User Guides, Schematic Diagrams or docs for : Agilent 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4]

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>> Download 5991-3517EN High Resolution Imaging with 7500 AFM - Application Note c20141020 [4] documenatation <<

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Keysight Technologies
High Resolution Imaging
with Keysight 7500 AFM


                                                       Application Brief




             Introduction
             Atomic force microscopy (AFM) was developed as a high resolution
             surface imaging technique, capable of imaging and probing mate-
             rial structures at the atomic or molecular level. The capability of
             obtaining high resolution images with ease on different materials,
             using various imaging methods such as contact and AC mode, has
             become expected for high performance scanning probe micros-
             copy (SPM) systems. On the other hand, the multitude of SPM ap-
             plications have also become more demanding in accurate position-
             ing and correct dimensional measurement. Consequently, a large
             range scanner (greater than 90 

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