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Q-
APPLICATION NOTE 117-1
Microwave
Network Analyzer
Applications
JUNE 1970 HEWLETT hp PACKARD
APPLICATION NOTE 117-1
MICROWAVE
NETWORK ANALYZER
APPLICATIONS
Copyright HEWLETT-PACKARD COMPANY 1970
1501 PAGE MILL ROAD, PALO ALTO, CALIFORNIA, U.S.A.
Printed: JUNE 1970
Revised: JANUARY 1978
HEWLETT lO; PACKARD
AN 117-1
HP 8410S Network Analyzer System
AN 117-1
TABLE OF CONTENTS
INTRODUCTION
HISTORICAL PERSPECTIVE ix
A NEW INSTRUMENT ix
WHAT IT CAN DO FOR YOU ix
SOME TYPICAL APPLICATIONS x
Filter Measurements xi
Semiconductor Measurements xi
THE APPLICATION NOTE xiii
I. BASIC CONCEPTS
INTRODUCTION 1-1
REFLECTION MEASUREMENTS 1-1
Reflection Coefficient 1-2
Test Setup 1-2
Impedance 1-3
Smith Chart 1-3
Standing Wave Ratio 1-4
Return Loss 1-4
TRANSMISSION MEASUREMENTS 1-4
Insertion 1-4
Incremental 1-4
Comparative 1-4
Test Setup 1-5
Magnitude and Phase Relationships 1-6
IMPORTANCE OF PHASE INFORMATION 1-7
In Radar Systems 1-7
In Communications Systems 1-7
In Microwave Component Design 1-8
SCATTERING {SI PARAMETERS 1-8
Definition 1-8
Lower Frequency Network Parameters -- Z, Y, H 1-8
S Parameters Related to Complex Reflection
and Transmission Coefficients 1-9
SUMMARY 1-10
II. THE HP 8410A NETWORK ANALYZER SYSTEM
INTRODUCTION 2-1
SYSTEM COMPONENTS 2-2
Block Diagrams for Reflection-Transmission Measurements
Using the HP 8410A Network Analyzer System 2-2
RF SOURCE - SWEEP OSCILLATOR {HP 8690B/8620A) 2-2
Harmonic Frequency Converter (HP 8411 A) and
Network Analyzer Mainframe (HP 8410A) 2-3
Frequency Translation by Sampling 2-3
Phase Lock 2-3
IF Substitution 2-4
AN 117-1
Output Display Plug-In Units 2-5
Phase-Magnitude Display (HP 8412A) 2-5
Phase-Gain Indicator (HP 8413A) 2-6
Polar Display (HP 8414A) 2-6
Output Interpretation 2-7
Reflection Coefficient Related to Complex
Impedance Using Smith Chart Overlay 2-8
Transducer 2-8
Operation 2-9
Types of Signal Splitters 2-9
Directivity of Couplers 2-10
Description of the Transducer Units 2-10
Transmission Test Unit - 8740A 2-10
Reflection Test Units - 8741A/8742A 2-10
Waveguide Reflection/Transmission
Test Unit - X8747A/P8747A 2-10
Reflection/Transmission Test Set - 8743A 2-11
S Parameter Test Set - 8745A 2-11
Choose Transducer by Application and
Frequency Range 2-11
SUMMARY 2-11
8410S Network Analyzer Systems 2-12
III. GENERAL APPLICATION PROCEDURES
INTRODUCTION 3-1
PRE-MEASUREMENT PROCEDURES 3-1
Setup 3-2
Connections 3-2
Test Phase-Lock and Reference Channel Power Level . . . 3-3
Power Considerations 3-5
Attenuation Measurements 3-6
Gain Measurements . 3-7
IV. HP 8745A TRANSDUCER APPLICATIONS
(0.11 -2.0 GHz)
INTRODUCTION 4-1
CALIBRATION 4-3
Reflection 4-3
Setup 4-3
Typical Results on Two Display Units 4-4
Transmission 4-6
Setup 4-6
Typical Results on Two Display Units 4-6
Benefits . 4-7
IV
AN 117-1
APPLICATIONS USING THE S PARAMETER
TEST SET (HP 8745A) 4-8
General Procedure 4-8
General Measurement and Setup 4-9
Transmission Measurement Applications 4-9
Attenuation of a Notch Filter 4-9
Purpose 4-9
Procedure 4-9
Results 4-9
Insertion Phase and Attenuation of a PIN Modulator 4-10
Purpose 4-10
Procedure 4-10
Results 4-10
Elimination of Linear Phase Shift 4-11
High Resolution Measurements of Transistor
Amplifier Gain 4-11
Purpose 4-11
Pre-Test Procedure 4-12
System Setup 4-12
System Power Levels 4-12
Grid Line Procedure 4-15
Test Procedure 4-15
Results 4-15
V. HP 8743A TRANSDUCER APPLICATIONS
(2- 12.4 GHz)
INTRODUCTION 5-1
CALIBRATION 5-3
Reflection 5-3
Setup 5-3
Typical Results on Two Display Units 5-4
Transmission 5-5
Setup 5-5
Typical Results on Two Display Units 5-6
APPLICATIONS USING THE
REFLECTION/TRANSMISSION TEST SET (HP 8743A) . . . 5-7
General Procedure 5-7
General Measurement Setup 5-7
Reflection Measurement Applications 5-9
Return Loss in a Cable 5-9
Purpose 5-9
Procedure 5-9
Cancellation of Directivity Vector 5-9
Results 5-9
Transmission Measurement Applications 5-12
Characteristics of a Bandpass Filter 5-12
Purpose 5-12
Procedure 5-12
Results . .5-12
AN 117-1
VI. HP 8745A S PARAMETER MEASUREMENTS
OF SEMICONDUCTOR DEVICES
INTRODUCTION 6-1
Accessories 6-1
Transistor Fixtures - HP 11600B/11602B 6-2
Transistor Bias Supply - HP 8717A 6-2
PROCEDURE FOR TRANSISTOR MEASUREMENTS 6-3
Calibration 6-3
Reflection 6-3
Setup 6-3
Typical Results on Two Display Units 6-4
Transmission 6-5
Setup 6-5
Typical Results on Two Display Units 6-5
Semiconductor Measurements 6-6
Purpose 6-6
Procedure 6-6
Reflection Measurements (Sn,S 2 2) 6-6
Results 6-6
Transmission Measurements (S 1 2 ,S 2 i) 6-9
Results 6-9
S PARAMETER TRANSISTOR MEASUREMENTS WITH
VERY LOW SIGNAL LEVELS 6-10
HP 11607A Adapter 6-11
NEGATIVE IMPEDANCE (TUNNEL DIODE)
MEASUREMENTS 6-11
Calibration 6-11
Measurement Setup and Procedure 6-13
Results 6-13
Determination of Tunneling Frequency Range 6-14
VII. 8747A WAVEGUIDE MEASUREMENTS
(X Band 8.2-12.4 GHz)
(PBand 12.4- 18 GHz)
INTRODUCTION 7-1
PROCEDURE FOR REFLECTION MEASUREMENTS 7-2
Equipment Setup 7-2
Calibration 7-2
Measurement 7-2
PROCEDURE FOR TRANSMISSION MEASUREMENTS . . 7-3
Equipment Setup 7-3
Calibration 7-3
Measurements 7-3
DIELECTRIC CONSTANT DETERMINATION 7-4
Theory 7-4
Procedure 7-5
Results 7-6
AN 117-1
VII. FURTHER APPLICATIONS
INTRODUCTION 8-1
REFLECTION MEASUREMENTS 8-1
Impedance 8-1
Antenna 8-1
YIG Resonant 8-2
Determination of Q 8-3
YIG Spheres 8-3
Cavities 8-4
TRANSMISSION MEASUREMENTS 8-5
Passband I nsertion 8-5
Gain 8-5
Amplifier 8-5
Antenna 8-6
Description of Q Measurement Overlay 8-7
APPENDIX
I. SCATTERING PARAMETERS TRANSFORMATIONS. . A-1
II. BASIC BLOCK DIAGRAMS A-3
Network Analyzer (8410A) and Harmonic Frequency
Converter (8411 A) A-3
Display Units
Phase-Magnitude (8412A) A-4
Phase-Gain Indicator (8413A) A-5
Polar Display (8414A) A-6
Transducers
Reflection/Transmission Test Set (8743A) A-7
S Parameter Test Set (8745A) A-8
III. RECOMMENDATIONS ON HANDLING AND CARE
OF APC-7 CONNECTORS A-9
IV. COMMON PRE-TEST PROCEDURES A-11
BIBLIOGRAPHY . A-13
VII
AN 117-1
INTRODUCTION
HISTORICAL PERSPECTIVE
For three decades, high frequency engineers have continued to
develop improved measuring methods and equipment. This evolu-
tionary growth has resulted from the development of more and
more complex high frequency networks and the resulting need to
fully characterize or analyze these networks over significant
bandwidths. The early slotted line techniques for making fixed
frequency, point-by-point, measurements of network parameters
was both tedious and time-consuming. In addition, this type of
measurement greatly restricted the amount of data available to the
engineer. For example, resonances between points of measurement
are missed and the skirt response of filters and amplifiers is not
adequately determined. These limitations prompted the develop-
ment of swept-frequency techniques which now offer an indis-
pensable tool for optimizing designs.
ANEW INSTRUMENT
The Hewlett-Packard 8410 series Network Analyzer represents
a major breakthrough in this evolutionary development of micro-
wave measurement instrumentation. This system incorporates the
advantages that swept techniques offer in addition to many new
features that now permit the microwave engineer to completely
characterize these complex networks with no degradation of
accuracy and in less time than it previously took to obtain
point-by-point magnitude-only measurements.
WHAT IT CAN DO FOR YOU
The HP 8410 is truly a network analyzer since it characterizes
networks or devices in terms of their complex small-signal scatter-
ing or S parameters, much like the low frequency engineers
characterize their networks in the familiar impedance or admit-
tance parameters. Measuring scattering parameters involves
measuring the ratio of the magnitudes and relative phase angles of
response and excitation signals at the ports of a network with the
other ports terminated in a specified characteristic or reference
impedance. Once the network parameters of a microwave device
or "black box" are known, the engineer then knows how this
device will operate when tied into an even more complex network
or grouping of black boxes. This is very important when using
solid-state active devices at microwave frequencies since there is
usually little extra power available and to insure optimal perfor-
mance of a system, the individual components of the system have
to be mated as perfectly as possible. The information required to
do this can be obtained from the 8410 Network Analyzer.
ix
AN 117-1
SOME TYPICAL APPLICATIONS
Figures 1-1 and I-2 illustrate two measurements made with the
network analyzer on a filter designed to operate in the microwave
frequency range.
AMPLITUDE L
10dB/DIV AMPLITUDE
RESPONSE
PHASE
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