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Charging Mitigation Strategies in Imaging
Insulating Polymer Spheres via Low Voltage
Field Emission Scanning Electron Microscopy
Application Note

Jining Xie
Agilent Technologies




Introduction                                 spatial resolution. Another dilemma
Because of its high resolution,              in SEM imaging of polymers is the low
broad range of magnifications and            contrast. Polymers usually consist of
straightforward image interpretation,        light elements (C, H, O and others). The
scanning electron microscopy (SEM) is        low atomic numbers of these elements
one of the common imaging techniques         in conjunction with the low density of
for morphological characterization           polymer results in a weak interaction
of polymeric materials with various          between the specimen atoms and the
shapes, crystalline forms, and               incident electrons leading to a poor
dimensions. Unfortunately, there             contrast [1, 2]. Possible methods to
are some technical difficulties that         enhance such a poor compositional
make SEM study of polymers quite             contrast are heavy-atom staining
challenging. The most notorious              and chemical extraction. In addition,
impediment of polymer imaging                polymers are susceptible to beam-
by SEM is charging because most              induced radiation damages. Since most
polymers are highly insulating (volume       of the energy carried by the electron
resistivity  10 15 

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