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Oscilloscopes in Manufacturing Test Pass fail mask testing speeds up automated testing 5990-9176EN c20121108 [2]


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                                            Oscilloscopes in Manufacturing Test

                                            Pass/fail mask testing speeds up
                                            automated testing



Agilent's InfiniiVision 2000, 3000 or 4000 X-Series
oscilloscopes can be optionally configured with
the industry's only hardware-based pass/fail mask
testing capability to achieve fast and reliable test
results in the manufacturing test environment.
Shipping reliable electronic products today often requires
that various signals within products be tested under
automated control to insure that they meet minimum
internal and/or external specified requirements. The
primary instrument used to test the parametric/analog
characteristics of signals is typically a digital storage
oscilloscope (DSO). Most of today's DSOs are fully
programmable and come with downloadable IVI drivers.
Whatever measurements that can be manually performed
on the bench, can usually be performed under automated
control. When selecting a scope for the manufacturing
test environment, the most important characteristics of         multiple characteristics of captured waveforms can be
the scope are accurate test results, fast test results, and     tested using a single mask. Rather than testing against
statistically reliable test results.                            a specific parameter, such a peak-to-peak voltage, mask
                                                                testing will test the overall shape of a waveform that may
Although one method of testing is to transfer waveform          include Vpp, rise time, pulse width characteristics, as well
arrays captured by the oscilloscope to a computer for           as maximum allowable noise.
further data crunching, a more efficient method is to let the
oscilloscope do the data crunching, and then just transfer
the results. Most of today's DSOs include built-in parametric
measurement capabilities such as rise time, amplitude,
and frequency measurements. Perhaps the only test
requirement is to determine whether or not a digital signal
meets a minimum rise time specification. Simply transfer
the measured numeric rise time value and then compare the
results against the specification.

Another method of automated waveform testing is pass/
fail mask testing as shown in Figure 1. With built-in
oscilloscope mask testing, pass/fail limit bands are either
established within or transferred to the scope. Captured        Figure 1: Mask testing can test multiple wave shape parameters
waveforms are then quickly compared against the limit           at once including maximum allowable noise.
bands (the mask). One advantage of mask testing is that
Another advantage when using the mask test capability in
Agilent's InfiniiVision X-Series oscilloscopes is their ability
to provide statistically reliable test results faster than other
scopes in the industry. With the oscilloscope industry's only
hardware-based mask testing, the 3000 and 4000 X-Series
scopes can test and compare over 200,000 waveforms
per second. Although one captured waveform may pass
a particular mask test, what if you need to test a million
waveforms to insure that you have statistically reliable test
results? Will they all pass?

In addition to fast test results, these scopes are also the
only scopes that can provide results in terms of Sigma               Figure 2: Pass/fail masks based on industry specifications can
quality standards. Desired manufacturing quality is often            be created on a PC and then downloaded to the scope.
based on a 6 standard, which relates to approximately 3 or
fewer defects per million. Figure 2 shows the statistical test       Agilent's InfiniiVision 2000, 3000, and 4000 X-Series
results of a mask test based on the capture and comparison           oscilloscopes
of 5,000,000 waveforms. In this example the scope detected
                                                                     If you are in the market today to purchase your next
6 failures, which relates to a Sigma quality of 6.2 out of a
                                                                     oscilloscope, Agilent Technologies' InfiniiVision X-Series
possible 6.5.
                                                                     oscilloscopes come in various bandwidth models ranging
                                                                     from 70 MHz up to 1.5 GHz. These scopes come with a
                                                                     standard 3-year warranty, as well as an industry-first 2-year
                                                                     recommended calibration cycle. When purchased with the
                                                                     mask test option, these scopes are the only scopes in the
                                                                     industry that can test over 200,000 waveforms per second to
                                                                     provide fast and statistically reliable test results.




Figure 2: Hardware-based mask testing provides fast and
statistically reliable test results that can be compared against 6
standards.
There are two different methods for creating a pass/fail
mask. One method is to input a "golden" waveform into the
scope and then have the scope automatically create the
mask based on a user-specified time and voltage tolerance
band around the "golden" waveform. This is the method
that was used in the previous two examples shown in                  To learn more about Agilent's InfiniiVision X-Series
Figures 1 and 2.                                                     oscilloscopes and mixed signal oscilloscopes,
                                                                     go to: www.agilent.com/find/infiniivision
Another method is to import a multi-region mask that
has been previously created on a PC based on published               Product specifications and descriptions in this document
standards. Figure 3 shows an example of an eye-diagram               subject to change without notice.
test based on an imported mask of an ARINC 429 serial bus            



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