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LIGHTWAVE CATALOG
Bit Error Ratio and Waveform Analysis
2014
VOLUME III
Agilent Technologies Lightwave Catalog 2014
Table of Content
www.agilent.com/find/lightwave
Get greater reliability--standard
For more than 30 years, Agilent offers high-performance solutions to support you in building the high-
speed communication network. Your experience and feedback helped us to continuously improve the
product performance and quality, while significantly reducing the cost, especially when it comes to manu-
facturing optical components.
Your needs and my confidence in our quality let me now offer our products with a 3-year warranty that's standard on all
instruments, worldwide. This combination of reliability and coverage brings you three key benefits: increased confidence in
instrument uptime, reduced cost of ownership and greater convenience. It's just one more way our solutions help you achieve
your business goals. When you choose Agilent, you get greater reliability--standard.
Juergen Beck
Vice President and General Manager
Digital Photonic Test Division
Volume 3: Bit Error Ratio and Waveform Analysis
Table of Content 2
Applications: Optimizing Manufacturing Test Cost 4
Applications: Optical Receiver Stress Test 5
Applications: Testing Transceivers Used in Fibre Channel Networks 8
Applications: Passive Optical Network (PON) Test Solution 9
Applications: Communications Waveform Measurements 10
Bit Error Ratio Test Solutions 12
Serial BERT Selection Table 13
NEW M8020A J-BERT High-Performance BERT 14
NEW
M8061A 32 Gb/s Multiplexer 2:1 with de-emphasis 15
N4960A Serial BERT 32 and 17 Gb/s 16
N4962A and N4963A Serial BERT 12.5G 19
N4965A Multi-Channel BERT 12.5G 20
N4967A 40Gb/s BERT System 21
N4980A Multi-Instrument BERT Software 22
N4970A PRBS Generator and N4984A Clock Divider Products 23
N4974A and N4975A PRBS Generators 24
N4903B J-BERT High-Performance Serial BERT 25
N4877A, N1070A CDR Solutions and N4876A 28.4 Gb/s Multiplexer 2:1 26
ParBERT 81250 Parallel Bit Error Ratio Tester 27
N5980A 3.125 Gb/s Manufacturing Serial BERT 28
N4906B-003 (3.6 Gb/s) & N4906B-012 (12.5 Gb/s) Serial BERT 29
N4917A Optical Receiver Stress Test Solution 30
86100D Wide-Bandwidth Oscilloscope 31
86108B Precision Waveform Analyzer 36
86100D Wide-Bandwidth Oscilloscope Selection Guide 37
Agilent Pulse Pattern Generators - Selection Guide 38
Product vs. Measurement Selection Table 39
2
J-BERT M8020A High-Performance BERT
3
Applications:
Optimizing Manufacturing Test Cost
www.agilent.com/find/dcax
Introduction Common transceiver types and manufacturing flows
Manufacturers of optical transceivers are faced with increasing challenges The number of communications standards and transceiver types has pro-
to their businesses, particularly how to reduce product cost. Pressures to liferated during the last decade creating more complexity for the typical
reduce cost as data rates rise means manufacturing engineering manag- manufacturing test facility. Mass market and other high volume transceiv-
ers and their engineers must be more creative in how to reduce costs be- ers typically have fewer tests and less temperature cycling. More complex
fore their competitors do. Traditional methods of eliminating tests or trying transceivers at higher data rates have more extensive tuning, temperature
to make tests run faster may not be feasible, may not yield the intended cycling and challenges to meet high desired yields.
benefit or may provide results that don't agree well with their customer's
measurements. The use of parallel testing promises huge improvements, The ultimate goal of Agilent's approach is to provide a sufficiently
but more innovation is needed. Read below, how Agilent helps to optimize accurate answer, very quickly, which is enabled by these recently intro-
the manufacturing processes of optical components. duced capabilities:
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