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Excerpt Edition
This PDF is an excerpt from Chapter 1
of the Parametric Measurement Handbook.
                                          The
                                          Parametric Measurement
                                          Handbook




                                                 Third Edition
                                                 March 2012
Chapter 1: Parametric Test Basics
                         "The central activity of engineering, as distinguished from science, is the design
                         of new devices, processes and systems." -- Myron Tribus



                         What is parametric test?
                         The question as to what constitutes parametric test is an interesting one and is
                         possibly open to some debate. Nevertheless, in general parametric test involves
                         the electrical testing and characterization of four main types of semiconductor
                         devices: resistors, diodes, transistors, and capacitors. This is not to say that
                         parametric test never involves the testing of other device types; however, the
                         vast majority of parametric test structures can be classified into one of these
                         categories or considered to be a combination of these categories.




                              Transistors                  Diodes           Resistors            Capacitors
                         Figure 1.1. Parametric test involves the testing of these four basic device types.

                         The vast majority of parametric testing involves either current versus voltage
                         (IV) or capacitance versus voltage (CV) measurements.

                         To many people parametric test means "DC" testing, but this is not an accurate
                         description. Of course, it can take source/monitor units (SMUs) anywhere from
                         milliseconds to seconds to make a measurement, which is certainly "slow" by
                         the standards of functional testers (which typically perform measurements in
                         the nanosecond or picosecond range). However, in recent years the need to
                         perform extremely fast parametric measurements (1 

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