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Thermistor Production Test Using the Keysight B2911A 5990-7117EN c20130107 [5]


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                                            Thermistor Production Test Using the
                                            Agilent B2900A Series of SMUs
                                            Technical Overview

                                            Agilent B2901/02/11/12A Precision Source/Measure Unit
                                               Agilent B2901A Precision SMU, 1ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse
                                               Agilent B2902A Precision SMU, 2ch, 100 fA resolution, 210 V, 3 A DC/10.5 A pulse
                                               Agilent B2911A Precision SMU, 1ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse
                                               Agilent B2912A Precision SMU. 2ch, 10 fA resolution, 210 V, 3 A DC/10.5 A pulse




Introduction                                                                          High force                DUT interface
Thermistors are devices that exhibit                                                               Test
variations in resistance as a function                                                             leads                Thermistor
of temperature. Due to this property,
thermistors are used for a variety of                        GPIB
                                                             LAN                      Low force
applications such as temperature
                                                             USB            GPIO                           Mechanical
sensors, current limiting devices and
                                                                                                           connection
liquid level sensors.

To ensure compliance with manu-                                                           Component handler
facturing specifications, single-point
pass/fail DC testing must be
performed on thermistor devices.            Figure 1. Example test system configuration using the B2900A Series of SMUs
Because these tests are also used to
identify and remove defective devices
before shipment, their reliability is       The Agilent B2901/02/11/12A                  the measurement results. In addition
important to guarantee product qual-        Precision Source/Measure Unit meets          to these comprehensive measure-
ity. In addition, it is also essential to   all of these requirements, making            ment capabilities, the B2900A Series
perform the tests quickly to keep the       it the best solution for thermistor          of SMUs possesses high throughput
production throughput high. However,        production test. It is an compact and        that reduces test times. The B2900A
the thermistor's sensitivity to tem-        cost-effective bench-top Source/             Series of SMUs also has many features
perature changes can work against           Measure Unit (SMU) with the capabil-         that make it well-adapted for produc-
measurement accuracy since Joule            ity to source and measure both volt-         tion test, such as pass/fail binning,
self-heating during measurement can         age and current. They cover currents         a digital I/O interface for handler
alter device characteristics. This          from 10 fA to 3 A (DC)/10.5 A (pulse)        control, and code compatibility with
requires measurement instrumentation        and voltages from 100 nV to 210 V.           standard single channel SMU products.
used for thermistor characterization        The B2900A Series of SMUs has
to possess both precise low-current         the ability to perform not only DC           This technical overview shows how
resistance measurement capability           measurements but also pulsed                 to use the B2900A Series of SMUs
and pulsed current measurement              measurements in order to prevent             for production test using a thermistor
capability (to minimize self-heating        device self-heating from distorting          device as an example.
effects).
Easy production test                     Program memory improves                           recall those strings multiple times
                                                                                           while the program is executing using
system configuration                     throughput                                        a single SCPI command. By storing
Figure 1 shows a conceptual diagram      Fast test times are essential to                  the command strings in memory, the
of a system based on the B2900A          maximize throughput and maintain                  time that would have been spent
Series of SMUs for production            high levels of factory productivity.              sending those same commands over
thermistor test. The widely available    Besides possessing fast intrinsic                 a communication bus is eliminated.
banana style terminals of the B2900A     measurement speed, the B2900A                     For tests that utilize lots of repeated
Series of SMUs greatly simplify the      Series of SMUs has a program                      code (such as subroutines), program
test system configuration. As will be    memory function that can be used to               memory can dramatically reduce test
discussed later, in most production      improve production test throughput.               times. Of course, programs can be
testing measurement results are          Program memory allows you to store                saved to or loaded from any attached
compared with pre-defined limits and     long strings of SCPI command lines                USB flash memory device (please see
pass/fail judgments are made. Output     once into the volatile memory of the              Figure 3).
signals from the GPIO port of the        B2900A Series of SMUs and then
B2900A Series of SMUs can be used
to communicate with the component
handler to sort devices based on the      B2900A Series                                    B2900A Series
pass/fail criteria. The thermistor is                                                                            RLead
usually placed on a temperature-            High force                             IMeas    High force                        IMeas
controlled DUT interface.                                           RLead
                                            High sense                                      High sense                        A
The B2900A Series of SMUs supports                  VMeas          VSet           RT                VMeas       VSet          RT
both 2-wire connection and 4-wire
                                            Low sense                                       Low sense                          B
connections. A basic 2-wire connec-                                 RLead
tion is commonly used for standard          Low force                                       Low force
resistance measurements, while a
4-wire connection is required for low
                                                a) 2-wire connection (RT



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