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Time Dependent and High-Speed Measurements 5-Time_Dependent_Highspeed_Measurement c20130117 [1]


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Excerpt Edition
This PDF is an excerpt from Chapter 5
of the Parametric Measurement Handbook.
                                          The
                                          Parametric Measurement
                                          Handbook




                                                 Third Edition
                                                 March 2012
Chapter 5: Time Dependent and High-Speed Measurements
                       "Experience is something you don't get until just after you need it." -- Anonymous

                       Introduction
                       One of the most prominent trends in parametric test is the movement away
                       from simple sweep and spot measurements (where measurement time is not an
                       important part of the measurement) to measurements where the speed at which
                       the measurement must be made is critical to the accuracy of the measurement.
                       In some cases this requires new types of measurement modules other than
                       SMUs, or even the integration of external instruments (pulse generators, oscil-
                       loscopes, etc.) with the parametric measurement equipment. However, some
                       of the newer parametric instruments (such as the Agilent B1500A and B1505A)
                       can make some impressive time sampling measurements just with their SMUs,
                       so it is worthwhile to spend some time discussing all of the available measure-
                       ment options.

                       Parallel measurement with SMUS
                       Parallel measurement is an important capability for all time dependent testing
                       done with SMUs. True parallel measurement with SMUs is only possible when
                       each SMU has its own analog-to-digital converter (ADC) available to it. The
                       Agilent parametric instruments with this capability are the E5270B, the B1500A
                       and the B1505A. For all of these instruments (except the E5260A Series), you
                       can select either a shared high-resolution (HR) ADC or a per-SMU high-speed
                       (HS) ADC for all of the various types of IV measurements as shown below.



                         High-speed                             A
                            ADC                                     V




                         High-speed                             A                        High-resolution ADC
                            ADC                                     V



                                               



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