Service Manuals, User Guides, Schematic Diagrams or docs for : Agilent journals 1960-12
<< Back | HomeMost service manuals and schematics are PDF files, so You will need Adobre Acrobat Reader to view : Acrobat Download Some of the files are DjVu format. Readers and resources available here : DjVu Resources
For the compressed files, most common are zip and rar. Please, extract files with Your favorite compression software ( WinZip, WinRAR ... ) before viewing. If a document has multiple parts, You should download all, before extracting.
Good luck. Repair on Your own risk. Make sure You know what You are doing.
Image preview - the first page of the document
>> Download 1960-12 documenatation <<
Text preview - extract from the document
HEWLETT-PACKARD
JOURNAL
TECHNICAL INFORMATION FROM THE -dp- LABORATORIES
Vol. 12. No. 4
BLISHED BY THE HEWLETT-PACKARD COMPANY, 1501 PAGE MILL ROAD, PALO ALTO, CALIFORNIA DECEMBER, 1960
Improved Sweep Frequency Techniques
for Broadband Microwave Testing
THE introduction of reflectometer methods and of There are many cases in the industry today where
the voltage-tuned microwave sweep generator1 3 microwave components leave a manufacturing plant
made available to the microwave engineer what has still containing narrow band "resonance" type ab
become a popular tool for rapidly gathering quanti sorptions or reflections that are outside the limit
tative information on microwave device perform specified by the manufacturer. It is obvious in these
ance over broad frequency ranges. Over a period of cases that the production tests were made on a point-
time several improvements in techniques have been by-point basis and that the narrow-band "spike" was
made and are presented in this article. These new missed. Indeed, it would be very expensive to test the
techniques apply to measurements both of reflection components at the number of single frequencies re
coefficient and of attenuation. They are suitable for quired to insure the absence of narrow resonances,
rapid and accurate full-range production testing of -hp-, on the other hand, in line with its philosophy
microwave components on a go-no go basis. They of "inexpensive quality," uses these sweep-frequency
have been in use in the -hp- microwave test depart methods on production components to assure full-
range performance.
ment for several years; indeed, it has been through
'J. K. Hunton and N. L. Pappas, "The -hp- Microwave Reflectometers,"
the efforts of that department to insure the utmost in Hewlett-Packard Journal, Vol. 6, No. 1-2, Sept.-Oct., 1954.
2Peter D. Lacy ana Daniel E. Wheeler, "Permanent Record and Oscillo
quality for -hp- microwave components that most of scope Techniques with the Microwave Sweep Oscillator," Hewlett-Pack
ard Journal, Vol. 9, No. 1-2, Sept.-Oct., 1957.
these "full range" testing methods have been refined 'Peter D. Lacy and Daniel E. Wheeler, "A New 8- 12 KMC Voltage
Tuned Sweep Oscillator for Faster Microwave Evaluations," Hewlett-
to their present form. Packard Journal, Vol. 8, No. 6, Feb., 1957.
485D/421A
DETECTOR
-hp- 532A/B -V-382A
FREQUENCY STANDARD
METER ATTENUATOR
-Ap- 7520 ; l-Ap- 752C |◦ Jabse Service Manual Search 2026 ◦ Jabse Pravopis ◦ onTap.bg ◦ Other service manual resources online : Fixya ◦ eServiceinfo