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TECHBRIEF4


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                                                   A Guide to Better Vector Network Analyzer
                                                   Calibrations for Probe-Tip Measurements



A vector network analyzer (VNA),                               6-mil distance       1-mil overlap of the        pitched probe heads at both sides
such as the HP 8510, 8753, or                                  between probe        probe blade on the ISS      (e.g., port-1 probe, 150 pm, port-2
87XX (includes 8719, 8720 and                                  blades               element                     probe, 200 pm).
8722) series, combined with                                                                                       Although the dominant VNA cali-
Cascade Microtech's 50-ohm                                                          Probes placed on a          bration method, the SOLT calibra-
probes, such as the WPH, ACP,                                                       through-connect, or         tion is not the best. Its disadvan-
FPC, or RFIC series, provides a                                                     line standard               tages include:
powerful tool for IC or module                                                                                  l Determining parasitic inductances
characterization, verification, or                                                  Probes placed on a            and capacitances is difficult, and
screening measurements. Calibrating                                                 short circuit standard        their values must be consistent
the VNA with standards at the                                                                                     with respect to a single reference
probe tips allows removal of repeat-                                                                              plane. For this reason, SOLT cali-
                                                                                    Probes placed on a
able errors from the VNA, cable,                                                                                  brations are best used below 20 GHz.
                                                                                    load, or match standard
and probe losses and reflections.                                                                               l Most standards to contact (typi-
  Accurate calibrations require care-                                                                             cally 6).
ful attention to the calibration                                                                                  LRM Calibration. With LRM,
                                                                                    Probes in the air, for an
method and elements used, probe                                                                                 you need three calibration stan-
                                                                                    open standard
tip physical placement accuracy,                                                                                dards: a line (or thru) standard, a
and system repeatability.                                                                                       reflect standard, which doesn't
                                                                                                                require characterization, and two
                                                               GSG probe tips on ISS standards.                 identical match (load) standards.
Impedance Standard Substrate                                                                                      With an LRM calibration, the
(ISS) elements                                                                                                  match (load) determines the refer-
                                                               Calibration methods reviewed
An ISS contains impedance stan-                                                                                 ence impedance. Cascade's VNA-
dards with known microwave char-                               There are numerous calibration                   Cal software also determines the
acteristics, used to calibrate the sys-                        methods available. The method you                inductance of the match standard
tem at the probe tips. The com-                                choose affects the calibration. To               during the calibration process.
monly used calibration standards                               compare two-port calibrations,                   Therefore, you only need to know
are: short-circuit, open-circuit, load,                        please refer to the table. Here we               its resistance (not its reactance), and
and thru. These correspond to com-                             explore the four most commonly                   you can accurately measure resis-
monly used coaxial calibration ele-                            used for wafer probe calibrations:               tance at dc.
ments (see Figure).                                            SOLT, LRM, LRRM, and TRL.                          The LRM method's advantages
  Cascade's ISS family includes:                                 SOLT Calibration. With SOLT,                   include:
Ground-Signal...................(103-726)                      the four known references are:                   l Greater S-parameter accuracy
                                                               short, open, load, and thru.                     l Match is the only impedance
LRM Ground-Signal-Ground                                         With SOLT, you must correctly                     needing self-consistent calibration
. . . . . . . . . . . . . . . . . . . . . . . . . .(101-190)   define the reference planes and par-                algorithm definition. This helps
                                                               asitic inductances and capacitances                you avoid errors caused by
Wide-Pitch, GSG & GS                                           for the short, open, and thru. At                   improperly defined open or short
. . . . . . . . . . . . . . . . . . (106-682, 106-683)         higher frequencies, inaccuracies in                 standards. The reference imped-
W-band...........................(104-783)                     the parasitic descriptions greatly                  ance is a well-behaved, trimmed
                                                               impact the accuracy of subsequent                   coplanar resistor and thus provides
General-Purpose..............(005-016)                         measurements.                                       a good match, enabling broad-
                                                                 The reference impedance in                        band, accurate calibrations.
                                                               SOLT on-wafer calibrations is a                  l Since the reflect only needs to be
                                                               physically small, trimmed, 50-ohm                   identical for each port, it's easy to
                                                               coplanar resistor. This resistor is                 realize physically.
                                                               best modeled as a constant resis-                l Suitable for systems with fixed
                                                               tance in series with a small, lumped
            CASCADE
                                              TM
                                                                                                                   probes, since it doesn't use stan-
                                                               reactance.                                          dards of varying separation.
                                                                 SOLT is useful for different
  LRRM Calibration. With this                        that impractical lengths are neces-                Cascade's VIVA-calibration software
LRM method variation, the                            sary at lower frequencies.                         ( VNACAL and WINCAL).
unknown reflects are undefined                      l Probe systems with fixed probes                     Carefully control probe tip place-
shorts and undefined opens. You                      are unable to accommodate the                      ment on the calibration elements.
need to measure the match on only                    additional TRL line standard                       Typically, these VNAs repeatably
one of the two ports. The match does                 length.                                            detect phase changes due to probe
not need to be exactly 50 ohms.                     l Loss in the thin film coplanar                    displacement as small as
  With LRRM, you need these cali-                    waveguide and microstrip lines                     5 pm. All Cascade ISSs (except
bration standards: a line (or thru)                  causes Z, errors. This directly                    005-016) include probe tip align-
standard, two different reflect stan-                affects the reference impedance of                 ment patterns for accurate align-
dards, which do not require charac-                  the calibration.                                   ments on the calibration elements,
terization, and a match (or load)                                                                       and are configured to work with
standard.                                                                                               Cascade's automated calibration
  The LRRM method has one key
                                                    Cascade's recommendations for
                                                                                                        software module (VNACAL-10K).
advantage over the LRM method: it
                                                    achieving the best calibration
                                                                                                        This module achieves the best
avoids discrepancies between the
                                                    accuracy
                                                                                                        probe placement repeatability and
load reactances seen by the port-I                  Choose the best calibration                         automates the whole calibration
and port-2 probes.                                  method for your measurement.                        process. The operator just places the
  TRL Calibration. Also called LRL                  Except for special cases, the LRM or                probe tips on the alignment marks
(Line-Reflect-Line), this method                    LRRM methods are superior for                       and starts the routine. (Refer to
uses: thru (or line), reflect, and one              most on-wafer or module and inter-                  Verification of LRRM Calibrations
or more delay lines.                                connect measurements. The                           with Load Inductance Compensation
  The TRL method uses the charac-                   firmware of the HP 85 10 B, C sup-                  for CPW Measurements on GaAs
teristic impedance of the delay lines               ports the LRM method. And the                       Substrates.)
to set the reference impedance (Z,).                HP 87XX VNAs support a limited                        Ensure system repeatability. The
  TRL method disadvantages                          LRM method. The LRRM method                         VNA, test set, coaxial cables,
include:                                            and LRM / LRRM load inductance                      probes, and any adapters must all
l You need more than one line                       corrections provide accuracy                        maintain very stable microwave
  length to cover greater than an 8:1               improvements over the basic LRM                     characteristics.
  frequency band. This also means                   method, and are only available in



Calibration                      Expected   Typical Accuracies
                     VNAs                                              Application Notes (available from Cascade)     What Cascade Recommends
 Methods                          Results    (w/ 8510 ~20 GHz)
  SOLT            8510A, B, C    good        0.09                    On-wafer measurements using the HP 8510        For probes other than GSG
                  87XX                                               Network Analyzer and Cascade Microtech         Only method for 8700 series
                                                                     waferprobes (HP product note 8510-6)           SOL (no T) for single-port cal-
                                                                                                                    ibrations


  LRM              8510 B, C     very        0.04                    40 GHz On- Wafer Measurements with the         8510 B, C two-port, front-
                   87xx'         good                                HP 8510 Network Analyzer and Cascade           panel calibrations with GSG
                                                                     Microtech Wafer Probes                         probes


  LRRM             8510 B, C     best        0.02                   LRM and LRRM Calibrations with Automatic All         other   measurements
(w/L connection                                                     Determination of Load Inductance



 TRL              8510 B, C     poor        0.15                    Applying the HP 851OB TRL Calibration for       Not generally recommended,
  (LRL)   2,      ,87XX1                                            Non-Coaxial Measurements (HP product            although Cascade supports the
                                                                    note 8510-8)                                    TRL method with its 8510
                                                                                                                    calibration kit (101-338)

 1 implemented through the TRL* calibration kit--not recommended for wafer calibrations
 2 not recommended by HP <5 GHz
 3 [Sij measured - Sij actual] when measuring a passive two-port



                                            Cascade Microtech, Inc., 2430 NW 206th Avenue, Beaverton, Oregon 97006, USA
                                            Tel: (503) 601-1000 Fax: (503) 601-1002 Email: [email protected]
                                            Japan: 03-5478-6100; UK: 44-1295-81-2828; www.cmicr.com
                                  \
                                            Copyright 0 1994 Cascade Microtech, Inc.
                           r A nrTM
               CASLHUC
               mm-                          Innovating Test Technologies                                                                      TECHBRIEF4-0694



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