Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley Appnotes 052207_4ACS

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052207_4ACS


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                                     A   GREAT ER   M EA SU R E      O F   C O N F I D E N C E     bring together a number of third-party soft-
                                                                                                   ware packages, speeding development time
                                                                                                   and increasing efficiency. The ACS software
                                                                                                   features five major functions; wafer descrip-
                                                                                                   tion, test setup, prober control, automation,
                                                                                                   and a summary report generator. The soft-
                                                                                                   ware lets users switch between lab use or
                                                                                                   manual operation and production or fully
                                                                                                   automatic mode with the same test plan.
                                                                                                       The ACS solution is a test plan devel-
                                                                                                   opment and execution platform centered
                                                                                                   around wafer-level device characterization
                                                                                                   and optimized for both the Keithley's Model
                                                                                                   4200-SCS (Semiconductor Characteriza-
                                                                                                   tion System) and the Series 2600 System
                                                                                                   SourceMeter



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