Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley Appnotes 2530 Parallel Test
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A G R E AT E R M E A S U R E O F C O N F I D E N C E Fast integration (17ms) for signal averaging is
used, and the fab's philosophy dictates opti-
mizing test structures for data integrity. Test
devices share few probe contact pads and
the scribe line test insert isn't optimized for
minimum area, allowing significant parallel-
ism with existing test structures and probe
cards. Parallel testing let this fab achieve
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