Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley Appnotes 2537 AdaptiveTes[1]

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                                      A   G R E AT E R      M E A S U R E   O F   C O N F I D E N C E     process control. Our definition of adaptive
                                                                                                          testing is not simply changing control limits
                                                                                                          after measurements are complete6. Instead,
                                                                                                          it involves changing force/measure levels or
                                                                                                          changing the number of sites test based on
                                                                                                          a well-documented decision process. Three
                                                                                                          primary components of a test strategy can be
                                                                                                          changed on the fly: (1) type and number of
                                                                                                          tests; (2) number of die tested, (3) number of
                                                                                                          wafers tested. Some or all of these test strat-
                                                                                                          egy components can be adaptively changed
                                                                                                          for operational benefit at the die (or site),
                                                                                                          wafer, and lot levels.
                                                                                                              Several characteristics of the parametric



Adaptive Test Adds
                                                                                                          test cell in the fab make it particularly ap-
                                                                                                          propriate for adaptive test techniques. Para-
                                                                                                          metric test uses a sampling strategy rather


Value to Parametric
                                                                                                          than measuring every die on every wafer, as
                                                                                                          in functional test. This allows adding or sub-
                                                                                                          tracting die as needed. Also, fabs typically


Electrical Wafer Probe                                                                                    measure three classes of electrical param-
                                                                                                          eters on wafers, so tests can also be added or
                                                                                                          subtracted as needed:
                                                                                                          

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