Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley Appnotes 2622 WLR

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                                                                                                                                  Reliability "Bathtub Curve"
                                       A   G R E AT E R      M E A S U R E          O F    C O N F I D E N C E



                                                                                                                    Failure                                            Lifetime
                                                                                                                     Rate                                               Failure
                                                                                                                                                                         Area



                                                                                                                                              Time

                                                                                                                    Figure 1. Typical semiconductor reliability
                                                                                                                    curve.

                                                                                                                        Stress-measure testing is a common tech-
                                                                                                                    nique used to evaluate operating lifetimes



Wafer Level Reliability
                                                                                                                    and wear-out failure mechanisms in semi-
                                                                                                                    conductor devices. This testing is focused
                                                                                                                    on failures on the right side of the typical


Testing 

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