Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley Appnotes 2762 Short Pulse

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2762 Short Pulse


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                                      A   G R E AT E R        M E A S U R E           O F    C O N F I D E N C E     Technology and Economics Drive
                                                                                                                     Testing Needs
                                                                                                                         Accelerated testing such as HCI and
                                                                                                                     NBTI can quickly generate curves that are
                                                                                                                     extrapolated to predict operating lifetime
                                                                                                                     and thereby provide insight into device de-
                                                                                                                     sign and manufacturing processes. The most



Short Pulse Testing
                                                                                                                     efficient method is to over-stress the device,
                                                                                                                     measure degradation trends of key operating
                                                                                                                     parameters, and extrapolate the data to the


Mandatory for
                                                                                                                     full lifetime (Figure 1).
                                                                                                                         However, it doesn't help if the extrapola-
                                                                                                                     tion isn't representative of the way a device


Semiconductor                                                                                                        is going to be used. For example, NBTI deg-
                                                                                                                     radation can relax when gate voltage stress is



Reliability
                                                                                                                     turned off. Then drain current and threshold
                                                                                                                     voltage may recover and change back toward
                                                                                                                     their original values 



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