Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley SCS 4200 4200 CV AN

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>> Download 4200 CV AN documenatation <<

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                                               Number 2239


Application Note                               Gate Dielectric Capacitance-Voltage
           Series                              Characterization Using the Model 4200
                                               Semiconductor Characterization System
Introduction                                                            Understanding MOS-Capacitor
Maintaining the quality and reliability of gate oxides is one of        C-V Measurements
the most critical and challenging tasks in any semiconductor fab.       C-V measurements are typically made on a capacitor-like device,
With feature sizes shrinking to 0.18

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