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a g r e at e r m easu r e of con f i dence www.keithley.com
What Is Ultra-Fast I-V?
Example Applications of Ultra-Fast I-V
Conclusion
ClICk hErE to stArt
Ultra-Fast I-V Applications
for the Model 4225-PMU Ultra-Fast I-V Module
www.keithley.com a g r e at e r m easu r e of con f i dence
Ultra-Fast I-V Applications
for the Model 4225-PMU
Ultra-Fast I-V Module
IntroductIon
Ultra-fast I-V sourcing and measurement have become increasingly important
capabilities for many technologies, including compound semiconductors,
medium power devices, non-volatile memory, MEMs (micro-electro-mechanical
devices), nanodevices, solar cells, and CMOS devices. Using pulsed I-V signals to
characterize devices rather than DC signals makes it possible to study or reduce
What Is Ultra-Fast I-V? the effects of self-heating (joule heating) or to minimize current drift or
degradation in measurements due to trapped charge. Transient I-V
measurements allow scientists and engineers to capture ultra high speed
current or voltage waveforms in the time domain or to study dynamic test Key Features and Specifications
Example Applications of Ultra-Fast I-V circuits. Pulsed sourcing can be used to stress test a device using an AC signal Each Model 4225-PMU Ultra-Fast I-V Module can provide two channels of high
during reliability cycling or in a multi-level waveform mode to program/erase speed, multi-level voltage pulse output while simultaneously measuring current
memory devices. The Model 4225-PMU Ultra-Fast I-V Module for the Model and voltage. It replaces traditional pulse/measure hardware configurations, which
Conclusion 4200-SCS Semiconductor Characterization System supports many of these typically included an external pulse generator, a multi-channel oscilloscope,
high speed source/measure applications. specially designed interconnect hardware, and integrated software.
The Model 4225-PMU has a number of key features:
n Integrated high speed sourcing and measurement capabilities,
hoME which allow for ultra-fast I-V testing
n Wide dynamic range of voltage sourcing, current measurement
(with auto-ranging), and timing parameters
n Broad array of applications
n Built-in interactive software for easy control
2
www.keithley.com a g r e at e r m easu r e of con f i dence
Ultra-Fast I-V Applications
for the Model 4225-PMU Ultra-Fast I-V Module
Integrated HIgH Speed SourcIng and MeaSureMent
Each module has two independent channels. Each channel can measure
both voltage and current simultaneously with parallel 14-bit A/D converters
with deep memory allowing up to one million samples at 5ns per sample.
These high speed measurement and storage capabilities support a wide
range of high speed applications, such as characterizing isothermal pulsed
I-V and transient effects of trapped charges on a device. Each channel can
output high accuracy voltage pulses as short as 60ns with a rise time as
short as 20ns. When the instrument's Segment ARB◦ Jabse Service Manual Search 2024 ◦ Jabse Pravopis ◦ onTap.bg ◦ Other service manual resources online : Fixya ◦ eServiceinfo