Service Manuals, User Guides, Schematic Diagrams or docs for : Keithley 2600 2634 Test Seq
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A G R E AT E R M E A S U R E O F C O N F I D E N C E ity. The integration of analog, digital, and
even RF circuitry on a single IC chip means
higher density and pin counts. Higher pin
counts require more test channels to main-
tain acceptable throughput. Test system den-
sity must also increase to stay within limited
production space.
Currently, production ATE systems can
be categorized as bulky, high cost main-
frame-based systems, slow instrument-based
systems using PC control, or fast instrument-
based systems that are extremely complex
to develop. None of these are optimized for
production processes. Manufacturers need
to improve the performance of existing test
stands, plus new test techniques, instru-
Built-in Sequencer
ments, and systems that minimize the cost
of testing and ongoing ownership costs.
These solutions should allow the systems to
Accelerates Testing
take on more of the test burden earlier in a
production cycle, thereby reducing high cost
end-of-the-line testing. In short, test systems
should:
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